Update to SEM/EDX capabilities

Category: Blog, Electronics Testing Blog, News

Posted By: | Date: May 18th, 2018


Our Topcon SM300 Scanning Electron Microscope has recently been updated and enhances the ITA Labs SEM capabilities.

The sample stage movement is now controlled by a joystick which improves our abilities to move the sample under analysis whilst it is within the SEM chamber.

SEM EDX EDS Scanning Electron Microscopy Services SEM EDX EDS Scanning Electron Microscopy Services

 


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