The ED-XRF Analysis is a method for measuring the thickness of coatings and for analysing materials.
XRF can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coating thickness and coating systems. In both laboratory and industrial environments, the ED-XRF method is now well established and can be readily utilised with modern equipment.ITA Labs uses a Fischerscope XDAL XRF for ED-XRF analysis.
Typical applications:
ITA Labs’ UK laboratory is experienced at providing thickness measurement and material analysis, with a fast turnaround, at very competitive rates using a Fischerscope XDAL XRF.
ITA Labs has UKAS 17025-2017 accreditation for this technique.
A short video about ED-XRF analysis can be viewed below.
To discuss your potential requirements, call Mark on 01727 871316.
Mark Dowling
+44 (0) 1727 871 316
Our team of expert consultants and technologists at ITA Labs, utilising a state-of-the-art laboratory, can assist with all your product development and testing needs. With over 90 years of specialist knowledge in materials analysis and troubleshooting, we offer independent and impartial support. We cater to a variety of sectors, including electronics, fire testing, fire retardant and polymer product development, tinplate packaging, and surface coating technology. Our organisation is designed to respond swiftly to projects of any size.
- ITA Labs, International Tin Association Ltd. Registered in England Number: 2994115 -
© 2024 ITA Labs - All rights reserved
